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/*
* Test-related constants for sandbox
*
* Copyright (c) 2014 Google, Inc
*
* SPDX-License-Identifier: GPL-2.0+
*/
#ifndef __ASM_TEST_H
#define __ASM_TEST_H
/* The sandbox driver always permits an I2C device with this address */
#define SANDBOX_I2C_TEST_ADDR 0x59
#define SANDBOX_PCI_VENDOR_ID 0x1234
#define SANDBOX_PCI_DEVICE_ID 0x5678
#define SANDBOX_PCI_CLASS_CODE PCI_CLASS_CODE_COMM
#define SANDBOX_PCI_CLASS_SUB_CODE PCI_CLASS_SUB_CODE_COMM_SERIAL
/**
* sandbox_i2c_set_test_mode() - set test mode for running unit tests
*
* See sandbox_i2c_xfer() for the behaviour changes.
*
* @bus: sandbox I2C bus to adjust
* @test_mode: true to select test mode, false to run normally
*/
void sandbox_i2c_set_test_mode(struct udevice *bus, bool test_mode);
enum sandbox_i2c_eeprom_test_mode {
SIE_TEST_MODE_NONE,
/* Permits read/write of only one byte per I2C transaction */
SIE_TEST_MODE_SINGLE_BYTE,
};
void sandbox_i2c_eeprom_set_test_mode(struct udevice *dev,
enum sandbox_i2c_eeprom_test_mode mode);
void sandbox_i2c_eeprom_set_offset_len(struct udevice *dev, int offset_len);
/*
* sandbox_timer_add_offset()
*
* Allow tests to add to the time reported through lib/time.c functions
* offset: number of milliseconds to advance the system time
*/
void sandbox_timer_add_offset(unsigned long offset);
#endif
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