cros_ec: Add vstore support

The EC can store small amounts of data for the benefit of the
verified boot process. Since the EC is seldom reset, this can allow the
AP to store data that survives a reboot or a suspend/resume cycle.

Add support for this.

Signed-off-by: Simon Glass <sjg@chromium.org>

1 files changed, 38 insertions, 0 deletions

diff --git a/test/dm/cros_ec.c b/test/dm/cros_ec.c
index 0da7548fd2..30cb70e088 100644
--- a/test/dm/cros_ec.c
+++ b/test/dm/cros_ec.c
@@ -56,6 +56,7 @@ static int dm_test_cros_ec_features(struct unit_test_state *uts)
 	ut_assertok(uclass_first_device_err(UCLASS_CROS_EC, &dev));
 	ut_assertok(cros_ec_get_features(dev, &feat));
 	ut_asserteq_64(1U << EC_FEATURE_FLASH | 1U << EC_FEATURE_I2C |
+		1u << EC_FEATURE_VSTORE |
 		1ULL << EC_FEATURE_UNIFIED_WAKE_MASKS | 1ULL << EC_FEATURE_ISH,
 		feat);
 
@@ -68,6 +69,7 @@ static int dm_test_cros_ec_features(struct unit_test_state *uts)
 	ut_assertok(run_command("crosec features", 0));
 	ut_assert_nextline("flash");
 	ut_assert_nextline("i2c");
+	ut_assert_nextline("vstore");
 	ut_assert_nextline("unified_wake_masks");
 	ut_assert_nextline("ish");
 	ut_assert_console_end();
@@ -138,3 +140,39 @@ static int dm_test_cros_ec_events(struct unit_test_state *uts)
 	return 0;
 }
 DM_TEST(dm_test_cros_ec_events, UT_TESTF_SCAN_FDT);
+
+static int dm_test_cros_ec_vstore(struct unit_test_state *uts)
+{
+	const int size = EC_VSTORE_SLOT_SIZE;
+	u8 test_data[size], data[size];
+	struct udevice *dev;
+	u32 locked;
+	int i;
+
+	ut_assertok(uclass_first_device_err(UCLASS_CROS_EC, &dev));
+	ut_asserteq(true, cros_ec_vstore_supported(dev));
+
+	ut_asserteq(4, cros_ec_vstore_info(dev, &locked));
+	ut_asserteq(0, locked);
+
+	/* Write some data */
+	for (i = 0; i < size; i++)
+		test_data[i] = ' ' + i;
+	ut_assertok(cros_ec_vstore_write(dev, 2, test_data, size));
+
+	/* Check it is locked */
+	ut_asserteq(4, cros_ec_vstore_info(dev, &locked));
+	ut_asserteq(1 << 2, locked);
+
+	/* Read it back and compare */
+	ut_assertok(cros_ec_vstore_read(dev, 2, data));
+	ut_asserteq_mem(test_data, data, size);
+
+	/* Try another slot to make sure it is empty */
+	ut_assertok(cros_ec_vstore_read(dev, 0, data));
+	for (i = 0; i < size; i++)
+		ut_asserteq(0, data[i]);
+
+	return 0;
+}
+DM_TEST(dm_test_cros_ec_vstore, UT_TESTF_SCAN_FDT);