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author | Anton Arapov <anton@redhat.com> | 2012-08-07 11:21:50 +0200 |
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committer | Anton Arapov <anton@redhat.com> | 2012-08-07 12:52:25 +0200 |
commit | 1d44b6f3fcf6058fb7c960b7558766967e8028f7 (patch) | |
tree | 53d88547c973ba048d233091a3f91f3173ad01df /Documentation/ABI/testing/sysfs-class-mtd | |
parent | d91eda5d7b0383e6a0c83e0146ff141ff3b1355b (diff) | |
download | kernel-uprobes-1d44b6f3fcf6058fb7c960b7558766967e8028f7.tar.gz kernel-uprobes-1d44b6f3fcf6058fb7c960b7558766967e8028f7.tar.xz kernel-uprobes-1d44b6f3fcf6058fb7c960b7558766967e8028f7.zip |
fedora kernel: 222b075b3ff0d9e88aa9353e3c80667756ed7361v3.5.0-4
Signed-off-by: Anton Arapov <anton@redhat.com>
Diffstat (limited to 'Documentation/ABI/testing/sysfs-class-mtd')
-rw-r--r-- | Documentation/ABI/testing/sysfs-class-mtd | 52 |
1 files changed, 52 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd index 4d55a188898..938ef71e203 100644 --- a/Documentation/ABI/testing/sysfs-class-mtd +++ b/Documentation/ABI/testing/sysfs-class-mtd @@ -123,3 +123,55 @@ Description: half page, or a quarter page). In the case of ECC NOR, it is the ECC block size. + +What: /sys/class/mtd/mtdX/ecc_strength +Date: April 2012 +KernelVersion: 3.4 +Contact: linux-mtd@lists.infradead.org +Description: + Maximum number of bit errors that the device is capable of + correcting within each region covering an ecc step. This will + always be a non-negative integer. Note that some devices will + have multiple ecc steps within each writesize region. + + In the case of devices lacking any ECC capability, it is 0. + +What: /sys/class/mtd/mtdX/bitflip_threshold +Date: April 2012 +KernelVersion: 3.4 +Contact: linux-mtd@lists.infradead.org +Description: + This allows the user to examine and adjust the criteria by which + mtd returns -EUCLEAN from mtd_read() and mtd_read_oob(). If the + maximum number of bit errors that were corrected on any single + region comprising an ecc step (as reported by the driver) equals + or exceeds this value, -EUCLEAN is returned. Otherwise, absent + an error, 0 is returned. Higher layers (e.g., UBI) use this + return code as an indication that an erase block may be + degrading and should be scrutinized as a candidate for being + marked as bad. + + The initial value may be specified by the flash device driver. + If not, then the default value is ecc_strength. + + The introduction of this feature brings a subtle change to the + meaning of the -EUCLEAN return code. Previously, it was + interpreted to mean simply "one or more bit errors were + corrected". Its new interpretation can be phrased as "a + dangerously high number of bit errors were corrected on one or + more regions comprising an ecc step". The precise definition of + "dangerously high" can be adjusted by the user with + bitflip_threshold. Users are discouraged from doing this, + however, unless they know what they are doing and have intimate + knowledge of the properties of their device. Broadly speaking, + bitflip_threshold should be low enough to detect genuine erase + block degradation, but high enough to avoid the consequences of + a persistent return value of -EUCLEAN on devices where sticky + bitflips occur. Note that if bitflip_threshold exceeds + ecc_strength, -EUCLEAN is never returned by the read operations. + Conversely, if bitflip_threshold is zero, -EUCLEAN is always + returned, absent a hard error. + + This is generally applicable only to NAND flash devices with ECC + capability. It is ignored on devices lacking ECC capability; + i.e., devices for which ecc_strength is zero. |